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Atomic Force Microscope

ACST Atomic Force Microscope (AFM) is a state-of-the-art instrument and has been designed in a bottoms-up approach for both ease-of-use and robustness. It is a truly multidisciplinary metrology and industry standard tool.

Research and Education Ready 
Robust & Multi-mode instrument (vibrating, non-vibrating, LFM, Conductive and Lithography)
Low cost of ownership
Modular Concept

Modes: Vibrating, Non Vibrating, Phase, Lateral Force Microscopy (LFM)

Z drive resolution < 0.075 nm

50-micron scan range

XY drive resolution: 1 nm open loop

3 mega-pixel CCD color camera

Video microscope (45x – 400x)

Linearized 60 μm X-Y scanner

Easy probe loader

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